Zeta-APS: Zeta Potential & Particle Sizing
Finally, you don't have to settle for Dilute Particle Size and Zeta Potential Data….
The patented, unique Zeta-APS performs simultaneous Particle Size and Zeta
Potential measurements on undiluted and/or opaque samples!
Better yet, unlike other particle size analyzers, you do not have to know a priori -
or guess- the PSD shape of your samples.
Matec Applied Sciences offers the most
powerful yet, easy to use particle size
and Zeta potential analyzer in the world,
the unique and patented Zeta-APS.
Call on the particle size and Zeta potential analysis leader for
the last twenty years, Matec Applied Sciences. Our knowledgeable staff
will gladly perform FREE sample analyses for evaluation;
or if you prefer, we will visit you for an on-site demonstration.
By combining Acoustic-Attenuation Spectroscopy and
Electro-acoustic techniques, simultaneous Particle Size Distribution
(PSD), and Zeta Potential (ZP) measurements are made without the
need for sample dilution which can lead to errors, be time
consuming, and change the sample's actual PSD and/or ZP.
Simultaneous measurement of Percent Solids, pH, Conductivity,
Temperature, Sound-Attenuation and Speed Spectra.
Patented PSD algorithm does not require user to guess or know a
priori the sample's PSD shape, e.g., Gaussian, lognormal,
unimodal, bimodal, etc.
Wide particle size range of analysis: 10 nm to over 100 microns.
Measurements can be made on a wide variety samples,
including aqueous, as well as, non-aqueous samples such as
pigments (organic or inorganic), inks, minerals, emulsions, metal
oxides, catalysts, nanoparticles, pharmaceuticals, biodispersions,
and many others.
Particle size measurements do not require minimum
particle/solvent density difference.
PSD of samples of low ZP, e.g. near their IEP, can be accurately
Absolute PSD data is provided. There is no need to calibrate with
particle size standards.
Easy analysis of opaque and/or highly viscous samples.
On-board sample mixing during measurement that prevents
Ability to pump samples during measurement for easy analysis of
Automatic PSD (inertia)-based correction on ZP data. This
correction is necessary due to particle-inertia effects on ZP
Automatic Iso-Electric Point (IEP) determination thanks to its
automated Potentiometric and Volumetric Titration capability.
Patented hardware design provides reliability, and ease of use
with minimal maintenance.
Suitable for R&D, Production, and on-line environments, as well as,
advanced R&D applications
How it works….
The Zeta-APS combines acoustic attenuation spectroscopy and electro-acoustics
in order to produce simultaneously particle size distribution (PSD) and Zeta potential
(ZP), as well as, percent solids data without the need for sample dilution. The
Zeta-APS also measures sound speed spectra, pH, conductivity, and temperature of
samples in the particle size range of 10 nm to 100 microns.
The Zeta-APS can be used in a wide range of R&D, as well as, industrial
production environments. Examples include:
Nanoparticles, Semiconductor Chemical Mechanical Polishing
(CMP) slurries -detect wafer-scratching oversize particles directly,
or determine the actual slurry detailed PSD for CMP-performance
monitoring-, Ceramics, Inks, Emulsion stability, O/W and W/O,
Pharmaceuticals, Biocolloids, Light Phosphors, Organic and
Inorganic Pigments such as TiO2 and Carbon Black, Catalysts,
Minerals, and many others.
The Zeta-APS software incorporates twenty years of instrument design
experience. Perform a particle size analysis with a simple mouse
click. Powerful graphics allow you to compare
data directly. Zeta-APS data files
can be readily imported into popular
spreadsheet software such as Microsoft Excel for
further analysis. The Zeta-APS can be used in
repetitive QC analysis settings without requiring highly trained
operators. Additionally, advanced research can be conducted thanks
to the Zeta-APS' powerful data analysis capabilities.
As sound travels through a slurry or colloid, it becomes attenuated. The
attenuation level is affected by the particle size. The Zeta-APS measures very
accurately acoustic attenuation over the 1-100 MHz frequency range. Because
sound travels through most media, Zeta-APS acoustic attenuation measurements
can be made on high-concentration and/or opaque samples. Particle settling is
not a problem since samples can be stirred or pumped during the measurement.
Zeta-APS sample analysis is quick and easy without requiring particle dilution
which is time consuming, error prone, and may alter the actual sample PSD.
Simply pour, or pump if so desired, your sample in the Zeta-APS sample cell and
the Zeta-APS' intuitive software does the rest in less than 10 minutes.
The Zeta-APS uses software developed and patented to calculate detailed PSD
data without the need for assumptions regarding the PSD shape. Typically,
ensemble-type instruments require that either the software or the operator assume
or guess whether the PSD is unimodal, bimodal, lognormal or Gaussian. Such
assumptions render the data unreliable.
The Zeta-APS' innovative patented hardware design simplifies operation while
minimizing maintenance. This platform is thus suitable for R&D, as well as, repetitive
QC measurements. The Zeta-APS is also ideal for process online operation.
The Zeta-APS measures Zeta potential by the Electrokinetic Sonic Amplitude (ESA)
Electro-acoustic method invented and patented by Matec Applied Sciences.
ESA, which does not need to use optical/laser means, consists of applying a highfrequency
electric field to the sample and measuring the resulting sound wave
amplitude and phase angle.
The ESA measurement is being used worldwide, in both academic and industrial
institutions, for the measurement of a wide variety of opaque, translucent,
aqueous, and non-aqueous samples without the need to perform sample dilution.
ESA applications include QC/Plant/R&D automated Iso-Electric Point (IEP)
determination (used in conjunction with the ESA automatic titrator),
surfactant/dispersant/flocculant effect studies, surface modifications, core-shell
systems, and many others.
The figure below shows overlaid Zeta- APS PSD plots from three
silica samples. The black and red curves represent blends of a 60
nm and a 300 nm silica samples. The Zeta-APS data accurately shows
the different 60/300 nm particle ratios. The blue curve corresponds
to a 300 nm sample by itself.
The next figure shows an example of an automatic,
unattended potentiometric titration of an alumina sample.
Its IEP location is readily determined by the Zeta-APS instrument.