APS-100: Total Particle Size Analysis

Perform detailed, absolute particle size analysis
and more...without dilution!

Finally, you don't have to settle for dilute Particle Size Data. The APS performs measurements on undiluted and/or opaque samples!

Better yet, unlike other particle size analyzers, you don't have to know a priori - or guess - the shape of your sample's Particle Size Distribution (PSD). Matec Applied Sciences and Lucent Technologies bring you the APS-100.
The APS produces undiluted PSD data simultaneously with acoustic attenuation and sound speed spectra, percent solids, pH, conductivity, and temperature.

Call on the particle size and Zeta potential analysis leader for the last twenty years, Matec Applied Sciences. Our knowledgeable staff will gladly perform FREE sample analyses for evaluation; or if you prefer, we will visit you for an on-site demonstration.

How it works

The APS produces PSD data from acoustic attenuation spectroscopy measurements without the need for sample dilution. The APS also measures sound speed spectra, pH, conductivity, and temperature of samples in the particle size range of 5 nm to 100 microns.

As sound travels through a slurry or colloid, it is attenuated. The level of attenuation is related to the particle size distribution. The APS measures acoustic attenuation very accurately over the 1-100 MHz frequency range. Because sound travels through all material media, APS acoustic attenuation measurements can be made on high-concentration and/or opaque samples. Particle settling is not a problem since samples can be stirred or pumped during the measurement. APS analysis is independent of the sample's Zeta potential level. The APS readily analyzes particles of zero, as well as, high electric charge.

APS sample analysis is quick and easy without requiring sample dilution, which is time consuming, error prone, and may alter the sample's actual PSD. Simply pour, or continuously pump your sample into the APS sample cell and the APS’ intuitive software
does the rest in minutes.

The APS uses software developed and patented by Lucent
Technologies to calculate detailed PSD data without the need for assumptions regarding the PSD shape . Other ensemble-type instruments, e.g., light-scattering, require that either the software or the operator assume or guess whether the PSD is unimodal, bimodal, lognormal or Gaussian. Such assumptions may render the data unreliable.

The patented APS hardware design simplifies operation while minimizing maintenance. This design is thus suitable for R&D, as well as, repetitive QC measurements. The APS is also suitable for process online operation.



The APS can be used in a wide range of R&D, as well as industrial production environments. Typical applications include:



Semiconductor Chemical Mechanical Polishing (CMP) slurries
Detect wafer-scratching oversized particles directly, or determine the slurry's actual, detailed PDS



  Emulsion stability,
O/W and W/O
Measure additive effects easily.



  Light Phosphors

  Organic and Inorganic Pigments such as Ti02 and Carbon Black



  Polymer Latex

  Aqueous and Non-aqueous Dispersions



The APS software incorporates twenty years of instrument design experience. Perform a particle size analysis with a simple mouse click. Powerful graphics allow you to compare data directly. The APS data files can be readily imported into popular spreadsheet software for further analysis.

The APS can be used in repetitive QC analysis settings without requiring highly trained operators. Additionally, advanced research can be conducted thanks to the powerful data analysis capabilities.

PSD computations are performed by patented software from Lucent Technologies. No assumptions are required regarding the shape of the PSD. The resulting PSD data is detailed and absolute since there is no need for calibration with particle size standards.

The figure to the left shows APS
PSD overlaid plots from three silica samples (same total percent solids).
The green and red curves represent blends of 60 nm and 300 nm silica samples. The APS data accurately reflects the different 60/300 nm particle ratios. The yellow curve corresponds to a 300 nm sample
by itself.


The figure to the right presents
the acoustic attenuation data,
in dB/cm vs. Frequency (MHz),
for these three samples. As the
ratio of 300 nm to 60 nm
particles increases, the shape
of the attenuation curve
changes, while the
attenuation level increases.